μ-Spot Spectroscopic Ellipsometer
페이지 정보
본문
Spectroscopic Ellipsometer(SE), the industry standard technology that enables one to accurately measure thickness and optical constants of thin film, simultaneously, is used for characterization of a variety of materials (e.g., dielectrics, semiconductors, organics, etc.) including AR coatings, OLED, and low(high)-materials.
◈FEATURE
1.Easy Operation & Fast Measurement
2.High Reproducibility
3.User-Friendly Operation
4.Non-contact & Non-destructive
5.Multi-Layer Measurement
6.In-Situ (Sutter, ALD,PECVD etc.)
Measuring constants | Film thickness, n, k vs λ |
Thickness range | sub Å ~ 10 μm (depends on film type) |
Wavelength range | 240 ~ 1050 nm (uv) |
Option of Spectral Range | |
- (Duv:190nm, IR: 900nm ~ 1700nm, 900nm~ 2,200nm) | |
Throughput | Normal mode(~10 sec), fast mode (1~3 sec) per point(depends on film type) |
Beam Spot-size | 25 μm, 50 μm, 100μm |
Angle of incidence | 45°~90° (Auto variable angle) |
Number of layers | Up to ten(10) layers (depends on film type) |
Repeatability | (3σ) ±0.3 Å on 10 times measurement |
Dispersion relations | Cauchy, Sellmeier, Lorentz, Tauc-Lorentz, Quantum-Mechanical, Drude-TL, Drude-QM and more |
Providing features | Refractive Index, Extinction coefficient and optical band gap |
Film density and composition, Material's dispersion function library | |
User defined models capability, Data import & export functions, - | |
Extendable library |
◈OPTION
1.Auto Mapping Stage (150 mm, 200 mm, 300 mm, Customized Size)
2.Option of Spectral Range (UV: 193 nm ~ 1,050 nm), (IR: 900nm ~ 1,700nm, 900nm~ 2,200nm)
3.Auto Alignment System, Automated Variable Angle of Incidence (45°~ 90°)
◈APPLICATION
·Thickness of Dielectrics, Semiconductors, Polymers,
·Supporting Backside/Front side Reflections
·Very Thin Films, Very Thick Films
·Variable Substrates (Silicon, GaAs, , Al, Steel, Glass, Al2O3, PC, PET, Polymer films and Others)
- Semiconductor : Si, Ge, ONO, ZnO, PR, poly-Si, GaN, GaAs, Si3N4
- Display(incl. OLED) : ITO, PR, MgO, Alq3 , CuPc, PVK, PAF, PEDT-PSS, NPB, SiO2 , ONO
- Dielectrics : SiO2 , TiO2 , Ta2O5 , ITO, AIN, ZrO2 , Si3N4 , Ga2O3 , Wet oxides
- Polymer : Dye, NPB, MNA, PVA, PET, TAC, PR
- Chemistry : Organic film(OLED) & LB Thin film
- Solar cell : SiN, a-Si, poly-Si, SiO2 , Al2O3
첨부파일
- μ-SpotSE_Catalog.pdf (2.2M) 331회 다운로드 | DATE : 2019-09-04 16:45:02